Advanced Sources for Single-event Effects Radiation Testing (ASSERT)

Archived

DARPA - Microsystems Technology Office

View on Grants.gov 📝 Build a proposal template ★ Save

Description

The Advanced Sources for Single-event Effects Radiation Testing (ASSERT) program will develop new capabilities for single-event effect (SEE) testing of 3D heterogeneously integrated (3DHI) electronic components and circuits. These capabilities will transform the current radiation-hardened electronics design and development process, resulting in the rapid deployment of next generation electronics to space and strategic warfighters. Key program goals include the generation of energetic particles with penetration depths of up to 5 mm in silicon with high-radiation-relevant linear energy transfers (LETs) and beam diameters <0.2 µm.

Who can apply

  • Others

Contact

BAA Coordinator<br/>HR001123S0047@darpa.mil
HR001123S0047@darpa.mil

Key dates & funding
  • PostedJul 5, 2023
  • ClosesSep 15, 2023
  • CFDA12.910
Categories
Science and Technology and other Research and Development

Pro insight

Edit and export this grant’s proposal template, plus deadline reminders, similar-grant suggestions, and funder history — all available with Pro.

Unlock with Pro