Integrity and Reliability of Integrated CircuitS (IRIS)

Archived

DARPA - Microsystems Technology Office

Description

Amendment 03: The purpose of this Amendment is to revise the Full Proposal Due Date as highlighted in yellow in the revised DARPA-BAA-10-33 document attached. Amendment 02: The purpose of this Amendment is to revise the Application Review Information, Section 6, of the BAA as highlighted in yellow. See the revised DARPA-BAA-10-33 attached. Amendment 01: The purpose of this amendment is to revise the abstract and proposal due dates. See the revised full DARPA-BAA-10-33 document with changes highlighted in yellow. Original synopsis below. DARPA is soliciting innovative research proposals in the area of integrated circuit (IC)analysis to determine functionality and reliability of complex integrated circuits for military applications. The objective of the Integrity and Reliability of Integrated Circuits (IRIS) program is to develop the technology to derive the functionality of an IC to determine unambiguously if malicious modifications have been made to that IC, and to accurately determine the IC’s useful lifespan from a physical perspective.See full DARPA-BAA-10-33 attached.

Who can apply

  • Unrestricted

Contact

BAA Coordinator
DARPA-BAA-10-33@darpa.mil

Key dates & funding
  • PostedSep 15, 2010
  • ClosesDec 17, 2010
  • Award floor$0
  • Award ceiling$0
  • CFDA12.910

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